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Wafer silicon optical test
Photoelectric detection analysis
Photoelectric detection analysis test system

Photoelectric detection analysis test system


Photoelectric detector parameter automatic test system solution

Introduction to the system scheme:


 The photodetector parameter automatic test system is a complete turnkey on-chip system integrating IV, CV, light responsivity and other test applications developed by our company for PD photodetector chips, mainly used to solve customer PD chips The research and development and automated screening test of the company, the system experience comes from the many years of testing experience in the field of optoelectronic modules, optoelectronic devices To package and probe station.


 GBIT TESTING has launched an industry-leading photoelectric detection analysis and test system solution. The system includes semi-automatic probe station, semiconductor parameter analyzer, LCR test instrument, laser light source, automatic control test software, and supporting dot function, supporting wafer from 2 The whole piece test from inches to 8 inches, and supports the test of fragments, including automatic XY correction and the most advanced Auto-Z technology in the industry.


Characteristics and advantages

Fast, efficient and stable photoelectric detector parameter automatic test system


GBIT TESTING system technical solutions:


It is mainly composed of high-precision semi-automatic photoelectric probe station, testing instrument and automatic control software. The parameters of photoelectric detector are tested by automatic light control and distinguished and compared. It has management, storage, processing and report functions.


Application area
PD type photodetection chip on-chip testOptoelectronic ModuleOptoelectronic device packaging
Optical communicationOptoelectronic chip testingOptical active device


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