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Solution
Wafer silicon optical test
Photoelectric detection analysis
The turn-key on-chip

Brief introduction of system scheme:

The photoelectric detector parameter automatic testing system is a complete turnkey on-chip system specially developed for PD photoelectric detector chips, which integrates IV, CV, photoresponsiveness and other testing applications. It is mainly used to solve the research and development of customers'PD chips and to automate screening and testing. The system experience comes from easy and convenient testing in photoelectric modules and photovoltaics. Years of testing experience in the field of device to package and probe station.


Characteristics and advantages

A Fast, Efficient and Stable Automatic Measuring System for Photoelectric Detector Parameters

Easy Testing System Technology Solution:

It is mainly composed of high precision semi-automatic photoelectric probe station, test instrument and automatic control software. It can test photoelectric detector parameters by automatic light control and distinguish and compare them. It has the functions of management, storage, processing and report forms.


Application area

On-chip Testing of Photoelectric Detector Chips of Type PD


Photoelectric module


Optoelectronic device packaging


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