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Wafer silicon optical test
Photoelectric detection analysis
Silicon Photonic Wafer Test System

Silicon photonics can transmit large amounts of data at high speeds using optical signals instead of electrical signals. The silicon photonics market is driving growth in data centers, automobiles and other applications because it can use silicon semiconductor manufacturing technology to create optical devices cost-effectively-reducing power consumption and size. According to data from Inkwood Research, the global silicon photonics market is expected to grow at a compound annual growth rate of 22.3% from 2017 to 2025.


GBIT TESTING  integrates the world's only MPI silicon photon measurement TS3000-SiPH and measurement software that can match Cascade (FormFactor), providing industry-leading automatic alignment and synchronization of optical and optoelectronic equipment testing capabilities.


What is silicon photonic testing?


The existing optical test method has very limited test structure and very low efficiency. If silicon optical chips start mass production, such low-efficiency testing obviously needs to be improved, and efficient, effective, and reliable testing programs must be adopted.


The ability to grow high-quality compound semiconductor materials on silicon has allowed us to leverage mature Logic and RFCMOS 300mm wafer production technology. This makes silicon the best choice for the development of highly integrated, multifunctional, low-cost photonic integrated circuits. Wafer-level photonic testing is a key capability for foundries to accelerate the development of manufacturing technology and device modeling, as well as to ensure production performance and yield. This seminar focuses on the challenges and solutions of wafer-level photonic testing. These include fast, repeatable optical coupling and fiber position optimization on the device to achieve accurate optical and electrical measurements.


In the entire optical module/device market, silicon photonics is mainly used in the field of active optical modules, which can replace passive components in the production of traditional optical modules and active chips other than lasers.


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Characteristics and advantages

GBIT TESTING integrates TS3000-SiPh's high-end probe station and Keysight's instruments to provide automatic alignment and synchronization of optical and optoelectronic equipment testing. The main functions of the integrated system include:


Features:


Six-axis automatic fiber positioning for precise alignment


Two-stage solution for rough and fine alignment


The optical alignment algorithm is integrated with high-speed hardware control to shorten the test time


MPI's SiPh software simplifies the integration of photonic application kits and optical instruments with multiple brands of measurement instruments


Customize scripts and test procedures to optimize the system to achieve fast and accurate measurements


Keysight's high-speed single-scan polarization-dependent loss (PDL) test can achieve high-precision and repeatable testing without prior polarization calibration.


Advantage:


Increase the amount of data


Faster transmission speed


Data quality


Lightweight device


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Minimize costs


Application area
Active optical modulePassive components and active chip device testingElectrical and optical equipment connection


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