The test/semiconductor in rf/microwave system integrators

About us

High-end

Supply world-class brand high-precision equipment

Professional

Widely used in semiconductor wafer field

Service

With 12 years of professional technology in system integration

Customized

Providing customized services for customers

Easy Testing (GBIT)

Shenzhen Easy Testing Technology Co., Ltd., referred to as Easy Testing (GBIT). China Semiconductor Testing and Radio Frequency Microwave Measurement System Solution Provider. Founded in 2011, the company is headquartered in Shenzhen, and has full-owned business offices in Beijing, Nanjing, Chengdu, Xi'an, Chongqing, Hong Kong and other places.

Your success is our honor.

Advanced test, Smart solution

Solutions are everywhere, but we only offer the smart ones.

Semiconductor Chip Reliability Service Specialist

Professional team + leading concept = business philosophy

Local access, global thinking.

Solutions

Photoelectric testing system Semiconductor in wafer Radio Frequency and Microwave Devices Electrical properties of materials Radar and Communication Countermeasure
The turn-key on-chip The turn-key on-chip The turn-key on-chip The turn-key on-chip
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chip The turn-key on-chip The turn-key on-chip The turn-key on-chip
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chip The turn-key on-chip The turn-key on-chip The turn-key on-chip
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chip The turn-key on-chip The turn-key on-chip The turn-key on-chip
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chip The turn-key on-chip The turn-key on-chip
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.

Products

Shenzhen EasyJet Testing has outstanding professional performance in the field of semiconductor testing and microwave in China. The company has signed cooperative agency agreements with many world-renowned brand manufacturers in semiconductor devices and precision testing fields.

Instruments and Apparatuses

Probe platform system

Microwave RF

Microwave accessories

Microwave simulation modeling

Test consumables

Customized Probe Platform and Fixture

Integrated testing software

We are committed to becoming the best system solution supplier in semiconductor testing and RF microwave measurement in China.

News / Events

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In modern communication systems

Meeting time: 6 December 8:00 AM ~5:00 PMVenue of the meeting: Reservation Hotel at Xinjiekou, Huaihai Road, Qinhuai District, Nanjing (notice after registration)Host Company: Shenzhen Easy Testing Te...
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Meeting time: 6 December 8:00 AM ~5:00 PMVenue of the meeting: Reservation Hotel...
Meeting time: 6 December 8:00 AM ~5:00 PMVenue of the meeting: Reservation Hotel...
Meeting time: 6 December 8:00 AM ~5:00 PMVenue of the meeting: Reservation Hotel...
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Shenzhen EasyJet Testing has a team of professional technical engineers with rich experience in electronic packaging testing and semiconductor industry. Our team can not only provide customers with high-quality and comprehensive services, but also formulate "tailor-made" style according to the actual production situation of customers. System application solution.
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Contact Us

Shenzhen City
Shenzhen futian district fu hong road,
dongni.zhang@gbit.net.cn
0755-83698930