The test/semiconductor in rf/microwave system integrators

About us

High-end

Supply world-class brand high-precision equipment

Professional

Widely used in semiconductor wafer field

Service

With 12 years of professional technology in system integration

Customized

Providing customized services for customers

Easy Testing (GBIT)

Shenzhen GBIT Co., Ltd., referred to as Easy Testing (GBIT). China Semiconductor Testing and Radio Frequency Microwave Measurement System Solution Provider. Founded in 2011, the company is headquartered in Shenzhen, and has full-owned business offices in Beijing, Nanjing, Chengdu, Xi'an, Chongqing, Hong Kong and other places.

Your success is our honor.

Advanced test, Smart solution

Solutions are everywhere, but we only offer the smart ones.

Semiconductor Chip Reliability Service Specialist

Professional team + leading concept = business philosophy

Local access, global thinking.

Solutions

Photoelectric testing system Semiconductor in wafer Radio Frequency and Microwave Devices Electrical properties of materials Radar and Communication Countermeasure
Silicon Photonic Wafer Te... Photoelectric detection a...
Silicon Photonic Wafer Test System
Photoelectric detection analysis test system
The turn-key on-chip
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chip The turn-key on-chip The turn-key on-chip Challenges of Passive Loa...
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
Challenges of Passive Load Pull and Wideband Modulated SignalsWhen working with modulated signals, i.e. for 4G, 5G and WLAN applications, for a well controlled linearity behavior of the DUT, the reflection coefficients offered to the DUT should ideally be constant (not vary versus frequency) within the modulation bandwidth at the fundamental, as well as in all related frequency bands at baseband and harmonic frequencies. This situation is approximated in real circuit implementations, where the matching networks are placed directly at the reference planes of the active device. In conventional load-pull setups, however, the actual physical impedance is always located at some distance from the DUT, which is much larger than for any practical matching network. This distance, as well as any physical length within the tuning element itself (such as the position of the probe in mechanical tuners), yields very large electrical delays causing rapid phase changes of the reflection coefficients versus frequency. It is clear that these large phase deviations represent nonrealistic circuit conditions and will cause measurement errors such as IM3 asymmetry, spectral re-growth and EVM degradation. In general, maintaining the reflection coefficients constant over frequency is getting more and more difficult with the increase in modulation bandwidth of communication signals, not only in practical circuits, but definitely in load pull measurement setups.
The turn-key on-chip
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chip The turn-key on-chip The turn-key on-chip
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.
The turn-key on-chipThe turn-key on-chip system for testing applications such as photoresponsiveness is mainly used to solve the research and development of customers'PD chips and automated screening test. The system experience comes from years of testing experience in the fields of photoelectric module, photoelectric device to package and probe station.

Products

Shenzhen EasyJet Testing has outstanding professional performance in the field of semiconductor testing and microwave in China. The company has signed cooperative agency agreements with many world-renowned brand manufacturers in semiconductor devices and precision testing fields.

instrument and meter

Probe platform system

Microwave RF

Microwave accessories

Microwave simulation modeling

Test consumables

ESD Test equipment

Faillure analysis systems

We are committed to becoming the best system solution supplier in semiconductor testing and RF microwave measurement in China.

News / Events

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In modern communication systems

Meeting time: 6 December 8:00 AM ~5:00 PMVenue of the meeting: Reservation Hotel at Xinjiekou, Huaihai Road, Qinhuai District, Nanjing (notice after registration)Host Company: Shenzhen Easy Testing Te...
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Meeting time: 6 December 8:00 AM ~5:00 PMVenue of the meeting: Reservation Hotel...
Meeting time: 6 December 8:00 AM ~5:00 PMVenue of the meeting: Reservation Hotel...
Meeting time: 6 December 8:00 AM ~5:00 PMVenue of the meeting: Reservation Hotel...
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Shenzhen EasyJet Testing has a team of professional technical engineers with rich experience in electronic packaging testing and semiconductor industry. Our team can not only provide customers with high-quality and comprehensive services, but also formulate "tailor-made" style according to the actual production situation of customers. System application solution.
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Contact Us

Shenzhen City (headquarter)
Shenzhen futian district fu hong road,
dongni.zhang@gbit.net.cn
0755-83698930